https://doi.org/10.7490/f1000research.1114428.1
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How to cite this poster:
Rao S, Ehosioke S, Lesparre N et al. Characterizing root system characteristics with Electrical Resistivity Tomography: a virtual rhizotron simulation [version 1; not peer reviewed]. F1000Research 2017, 6:1146 (poster) (https://doi.org/10.7490/f1000research.1114428.1)
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Characterizing root system characteristics with Electrical Resistivity Tomography: a virtual rhizotron simulation

Sathyanarayan Rao1, Solomon Ehosioke, Nolwenn Lesparre, Frédéric Nguyen, Mathieu Javaux
Author Affiliations
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Published 19 Jul 2017

Characterizing root system characteristics with Electrical Resistivity Tomography: a virtual rhizotron simulation

[version 1; not peer reviewed]

Sathyanarayan Rao1, Solomon Ehosioke, Nolwenn Lesparre, Frédéric Nguyen, Mathieu Javaux
Author Affiliations
1 Catholic University of Leuven, Belgium
Presented at
The EGU General Assembly 2015
Abstract
Competing Interests

No competing interests were disclosed

Keywords
Plant root zone imaging, electrical resistivity tomography
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